Polarization contrast in photon scanning tunnelling microscopy combined with atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Keysight Technologies Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy
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ژورنال
عنوان ژورنال: Journal of Microscopy
سال: 1995
ISSN: 0022-2720
DOI: 10.1111/j.1365-2818.1995.tb03672.x